The University of Sydney’s research scientists claim that they have developed a technology that would lengthen the lifespan of electronic devices. This marks a significant milestone in the field of materials science, for the first time providing a full picture of the occurrence of fatigue in ferroelectric materials.

Ferroelectric materials are used in many devices, including memories, capacitors, actuators and sensors. These devices are commonly used in both consumer and industrial instruments, such as computers, medical ultrasound equipment and underwater sonars. Over time, ferroelectric materials are subjected to repeated mechanical and electrical loading, leading to a progressive decrease in their functionality, ultimately resulting in failure. This process is referred to as 'ferroelectric fatigue'.

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It is the main cause of the failure of a range of electronic devices, with discarded electronics a leading contributor to e-waste. Globally, tens of millions of tonnes of failed electronic devices go to landfill every year. The discovery is a significant scientific breakthrough as it shows a clear picture of how the ferroelectric degradation process is present at the nanoscale.